Spatial Resolution, Information Limit, and Contrast Transfer in Piezoresponse Force Microscopy... Journal July, 2006
Depth Sectioning with the Aberration-Corrected Scanning Transmission Electron Microscope Journal February, 2006
Depth Sectioning of Aligned Crystals with the Aberration-Corrected Scanning Transmisstion Electron Microscope Journal January, 2006
Low Temperature Resistance Anomaly at SrTiO3 Grain Boundaries - Evidence for Interface Induced Phase Transition... Journal November, 2005
Three Dimensional Imaging of Individual Hafnium Atoms at a Si/SiO2/HfO2 Dielectric Interface Journal August, 2005
Radial Distribution Function Analyses of Amorphous Carbon Films Containing Silicon and Hydrogen by Energy-Filtered Diffraction and EXELFS Journal August, 2005
Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope Journal August, 2005
Three-Dimensional Imaging of Individual Hafnium Atoms Inside a Semiconductor Device... Journal July, 2005
Limitations to the Measurement of Oxygen Concentrations by HRTEM Imposed by Surface Roughness Journal April, 2005
