Stephen Jesse Section Head of Nanomaterials Characterization at the CNMS Contact SJESSE@ORNL.GOV All Publications Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space Direct-write liquid phase transformations with a scanning transmission electron microscope... Phases and interfaces from real space atomically resolved data: physics based deep data image analysis... Nanoforging of Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams Data Analytics Applied to Chemical Transformations in Liquids Phase determination from atomically resolved images: physics-constrained deep data analysis through an unmixing approach Directing Matter: Towards Atomic Scale 3D Nanofabrication Dynamic scan control in STEM: Spiral scans BEAM: A computational workflow system for managing and modeling material characterization data in HPC environments G-Mode Magnetic Force Microscopy: Separating magnetic and electrostatic interactions using big data analytics... Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy... Unraveling the Mechanism of Nanoscale Mechanical Reinforcement in Glassy Polymer Nanocomposites Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography... Correlation between Piezoresponse Nonlinearity and Hysteresis in Ferroelectric Crystals at Nanoscale... Solid-state electrochemistry on the nanometer and atomic scales: the scanning probe microscopy approach Nanoscale elastic changes in two-dimensional Ti3C2Tx (MXene) pseudocapacitive electrodes... Polarization control via He-ion beam induced nanofabrication in layered ferroelectric semiconductors Highly mobile ferroelastic domain walls in compositionally graded ferroelectric thin films... Graphene Engineering by Neon Ion Beams Multifrequency spectrum analysis using fully digital Gmode-Kelvin probe force microscopy ... Direct-write liquid phase transformations with a scanning transmission electron microscope Polarization Control via He-Ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors Rapid Mapping of Polarization Switching through Complete Information Acquisition Acoustic Detection of Phase Transitions at the Nanoscale BEAM: A Computational Workflow System for Managing and Modeling Material Characterization Data in HPC Environments Pagination First page « First Previous page ‹â¶Ä¹ … Page 6 Current page 7 Page 8 … Next page ›â¶Äº Last page Last » Key Links Curriculum Vitae Organizations Physical Sciences Directorate User Facilities Center for Nanophase Materials Sciences Nanomaterials Characterization Section
Research Highlight High-speed Mapping of Surface Charge Dynamics using Sparse Scanning Kelvin Probe Force Microscopy (SS-KPFM)
