Stephen Jesse Section Head of Nanomaterials Characterization at the CNMS Contact SJESSE@ORNL.GOV All Publications A Framework to Learn Physics from Atomically Resolved Images Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform G-mode - Full Information Capture Applied to Scanning Probe Microscopy Full Information Acquisition in Scanning Probe Microscopy Enhancing Ion Migration in Grain Boundaries of Hybrid Organic-Inorganic Perovskites by Chlorine Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale Mixed electrochemical–ferroelectric states in nanoscale ferroelectrics Improved Spatial Resolution for Spot Sampling in Thermal Desorption Atomic Force Microscopy - Mass Spectrometry via Tailored ... Direct imaging of the relaxation of individual ferroelectric interfaces in a tensile-strained film... Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways Synergetic effects of K+ and Mg2+ ion intercalation on the electrochemical and actuation properties of the two-dimensional Ti3C2 MXene Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy Enhancing Ion Migration in Grain Boundaries of Hybrid Organic–Inorganic Perovskites by Chlorine Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G‑Mode Platform Mixed electrochemical–ferroelectric states in nanoscale ferroelectrics Exploring Polarization Rotation Phase Instabilities in Super-Tetragonal BiFeO3 Epitaxial Thin Films and Their Technological I... Data Mining Graphene: Correlative Analysis of Structure and Electronic Degrees of Freedom in Graphenic Monolayers with Defect... Contradictory nature of Co doping in ferroelectric BaTiO3 Rapid Mapping of Polarization Switching through Complete Information Acquisition... Quantification of Surface Displacements via Cantilever Contact Resonance in Dynamic Atomic Force Microscopy Imaging via complete cantilever dynamic detection: General Dynamic Mode Imaging and Spectroscopy in Scanning Probe Microscopy Single domain multiferroic BiFeO3 films... Big, deep, and smart data in scanning probe microscopy Nanoforging of Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams Pagination First page « First Previous page ‹Ĺ … Page 5 Current page 6 Page 7 … Next page ›ĺ Last page Last » Key Links Curriculum Vitae Organizations Physical Sciences Directorate User Facilities Center for Nanophase Materials Sciences Nanomaterials Characterization Section
Research Highlight High-speed Mapping of Surface Charge Dynamics using Sparse Scanning Kelvin Probe Force Microscopy (SS-KPFM)
