Stephen Jesse Section Head of Nanomaterials Characterization at the CNMS Contact SJESSE@ORNL.GOV All Publications Direct atomic fabrication and dopant positioning in Si using electron beams with active real-time image-based feedback Direct atomic fabrication and dopant positioning in Si using electron beams with active real-time image-based feedback Machine Detection of Enhanced Electromechanical Energy Conversion in PbZr0.2Ti0.8O3 Thin Films Deep data analysis via physically constrained linear unmixing: universal framework, domain examples, and a community-wide platform Machine learning–enabled identification of material phase transitions based on experimental data: Exploring collective dynamics in ferroelectric relaxors Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging Two-level structural sparsity regularization for identifying lattices and defects in noisy images Multi-purposed Ar Gas Cluster Ion Beam Processing for Graphene Engineering Direct imaging of the spatial and energy distribution of nucleation centres in ferroelectric materials Placing single atoms in graphene with a scanning transmission electron microscope Chemical nature of ferroelastic twin domains in CH3NH3PbI3 perovskite Nanoscale mapping of ion diffusion in a lithium-ion battery cathode Fire up the atom forge Building Structures Atom by Atom via Electron Beam Manipulation Measuring oxygen reduction/evolution reactions on the nanoscale Mitigating e-beam-induced hydrocarbon deposition on graphene for atomic-scale scanning transmission electron microscopy studies Machine learning–enabled identification of material phase transitions based on experimental data: Exploring collective dynamics in ferroelectric relaxors Deep learning of atomically resolved scanning transmission electron microscopy images: chemical identification and tracking local transformations Automated Interpretation and Extraction of Topographic Information from Time of Flight Secondary Ion Mass Spectrometry Data Metal/Ion Interactions Induced p–i–n Junction in Methylammonium Lead Triiodide Perovskite Single Crystals Direct Probing of Polarization Charge at Nanoscale Level Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion Beam Three-State Ferroelastic Switching and Large Electromechanical Responses in PbTiO 3 Thin Films Placing single atoms in graphene with a scanning transmission electron microscope... G-mode - Full Information Capture Applied to Scanning Probe Microscopy Pagination First page « First Previous page ‹â¶Ä¹ … Page 4 Current page 5 Page 6 … Next page ›â¶Äº Last page Last » Key Links Curriculum Vitae Organizations Physical Sciences Directorate User Facilities Center for Nanophase Materials Sciences Nanomaterials Characterization Section
Research Highlight High-speed Mapping of Surface Charge Dynamics using Sparse Scanning Kelvin Probe Force Microscopy (SS-KPFM)
