Stephen Jesse Section Head of Nanomaterials Characterization at the CNMS Contact SJESSE@ORNL.GOV All Publications Doping of Cr in Graphene Using Electron Beam Manipulation for Functional Defect Engineering Statistical learning of governing equations of dynamics from in-situ electron microscopy imaging data... Tracking atomic structure evolution during directed electron beam induced Si-atom motion in graphene via deep machine learning A self-driving microscope and the Atomic Forge Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening Charges Dynamic Manipulation in Piezoresponse Force Microscopy: Creating Nonequilibrium Phases with Large Electromechanical Response Super-resolution and signal separation in contact Kelvin probe force microscopy of electrochemically active ferroelectric materials Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Opt... Tracking ion intercalation into layered Ti 3 C 2 MXene films across length scales Bayesian inference in band excitation scanning probe microscopy for optimal dynamic model selection in imaging... Local Strain and Polarization Mapping in Ferrielectric Materials Super-Graphene: The Role of Temperature on Radiation Resistance Imaging Conductivity in a Single Atomic Layer Tensor factorization for elucidating mechanisms of piezoresponse relaxation via dynamic Piezoresponse Force Spectroscopy Reconstruction of effective potential from statistical analysis of dynamic trajectories Reconstruction of the interatomic forces from dynamic scanning transmission electron microscopy data Electron-beam introduction of heteroatomic Pt–Si structures in graphene Strain–Chemical Gradient and Polarization in Metal Halide Perovskites To switch or not to switch – a machine learning approach for ferroelectricity Variable voltage electron microscopy: Toward atom-by-atom fabrication in 2D materials Direct matter disassembly via electron beam control: electron-beam-mediated catalytic etching of graphene by nanoparticles... Detection of defects in atomic-resolution images of materials using cycle analysis... Imaging mechanism for hyperspectral scanning probe microscopy via Gaussian process modelling Twin domains modulate light-matter interactions in metal halide perovskites Tunable quadruple-well ferroelectric van der Waals crystals Pagination First page « First Previous page ‹Ĺ … Page 2 Current page 3 Page 4 … Next page ›ĺ Last page Last » Key Links Curriculum Vitae Organizations Physical Sciences Directorate User Facilities Center for Nanophase Materials Sciences Nanomaterials Characterization Section
Research Highlight High-speed Mapping of Surface Charge Dynamics using Sparse Scanning Kelvin Probe Force Microscopy (SS-KPFM)
