Abstract
Quartz single-crystal samples consisting of 伪-quartz crystal structure were neutron irradiated to fluences of 5 脳 1018, 4 脳 1019, and 2 脳 1020 n/cm2 (E > 0.1 MeV) at two temperatures (52 and 95 掳C). The changes in the 伪-quartz phase as a function of these two conditions (temperature and fluence) were studied using X-ray powder diffraction (XRD), Raman spectroscopy, and transmission electron microscopy (TEM), and the results acquired using these complementary techniques are presented in a single place for the first time. XRD studies showed that the lattice parameters of 伪-quartz increased with increasing neutron flux. The lattice growth was larger for the samples that were neutron irradiated at 52 掳C than at 95 掳C. Moreover, an amorphous content was determined in the quartz samples neutron irradiated at 4 脳 1019 n/cm2, with the greater amount being in the 52 掳C irradiated sample. Complete amorphization of quartz was observed at a fluence of 2 脳 1020 n/cm2 (E > 0.1 MeV) using XRD and confirmed by TEM characterization and Raman spectroscopic studies. The cause for 伪-quartz lattice expansion and sample amorphization was also explored using XRD and Raman spectroscopic studies.
